Sample analysis systems and methods of use thereof
US11380534B2 · kind B2 · utility
0Cited by
25References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2020 |
| Grant date | Jul 5, 2022 |
| Priority date | — |
| Expiry date | Jun 8, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/142
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.