Calibration verification for optical particle analyzers
US11385161B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2020 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Apr 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1459
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.