Method for calibrating an analysis device, and associated device
US11385164B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 27, 2018 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | May 23, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2227/03
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibration of a device for analyzing at least one element present in a sample, said device including: a detection assembly configured to acquire an image formed by the interference between a light source and said sample; and digital processing means configured to detect a digital position of at least one element in said sample based on said acquired image; said calibration method including the implementation of a plurality of predetermined displacements of said sample with respect to said detection assembly and, for all of said displacements, the detection of a digital position of a same element to determine the digital position and the real position matching model according to the predetermined displacements and to the digital positions of said element after each displacement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.