Apparatus for testing electronic components
US11385257B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 23, 2020 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Nov 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for testing electronic components includes a base, a screw rod structure, a first sliding portion, a second sliding portion, a vacuum-based or similar adsorption structure, and a probe. The screw rod structure is fixedly connected to one side of the base. The first sliding portion is slidably positioned on the screw rod structure. The second sliding portion is slidably positioned on the first sliding portion. The adsorption structure is arranged on the second sliding portion. The adsorption structure gathers and holds an electronic component. The probe and the electronic component are arranged to correspond. The probe is electrically connected to a test device. The test device tests the electronic component through the probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.