Artefact classification using xenospace centroids
US11386308B2 · kind B2 · utility
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Key dates
| Filing date | Dec 13, 2018 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Jul 11, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An artefact is received and parsed into a plurality of observations. A first subset of the observations are inputted into a machine learning model trained using historical data to classify the artefact. In addition, a second subset of the observations are inputted into a xenospace centroid configured to classify the artefact. Thereafter, the artefact is classified based on a combination of an output of the machine learning model and an output of xenospace centroid. Related apparatus, systems, techniques and articles are also described.
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