Image based counterfeit detection
US11386540B2 · kind B2 · utility
0Cited by
9References
4Claims
0Family size
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Key dates
| Filing date | Mar 22, 2018 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Oct 22, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for authenticating material samples are provided. Digital images of the samples are processed to extract computer-vision features, which are used to train a classification algorithm. The computer-vision features of a test sample are evaluated by the trained classification algorithm to identify the test sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.