System and method for cyber-physical inspection and monitoring of nonmetallic structures
US11386541B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2019 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Aug 22, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A technological solution for analyzing a sequence of electromagnetic spectrum image frames of a nonmetallic asset and detecting or predicting an aberration in the asset, including a detected or predicted location of the aberration. The technological solution includes receiving the electromagnetic spectrum image frames by a pair of machine learning systems of different types, applying a machine learning algorithm to the electromagnetic spectrum image frames to stratify the electromagnetic spectrum images into abstraction levels according to an image topology and output first aberration determination information, applying a second machine learning algorithm to the electromagnetic spectrum image frames to detect patterns in electromagnetic spectrum images over time and output second aberration determination information, generating an aberration assessment based on the first and second aberration determination information, and transmitting the aberration assessment to a communicating device, including a prediction and location of an aberration in or on the nonmetallic asset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.