System and method for testing photosensitive device degradation
US11387779B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2020 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Oct 5, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/50
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.