Patent · US Active

Test element analysis system for the analytical examination of a sample

US11391676B2 · kind B2 · utility

0Cited by

5References

11Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Lars Fischheiter · Ludwigsburg, DE
Reiner Stein · Bad Kreuznach, DE
Martin Goebel · Weinheim, DE

Key dates

Filing date	Apr 10, 2019
Grant date	Jul 19, 2022
Priority date	—
Expiry date	Oct 31, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01N2035/00128
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test element analysis system for analytical examination of a sample. The system comprises a measurement device, which comprises a test element receptacle for receiving at least one test element at least partially, wherein the receptacle comprises at least one first and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element, wherein the second part is movable relative to the first part, wherein the receptacle is configured to position the second part such that a test element may be inserted into the receptacle and to subsequently position the second part in a closed position such that at least one abutment surface of the second part rests on the test element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.