Patent · US Active

Process state analysis device and process state display method

US11393143B2 · kind B2 · utility

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10Claims
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Key dates

Filing dateMay 23, 2019
Grant dateJul 19, 2022
Priority date
Expiry dateMay 23, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG09G2340/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An embodiment of the process state analysis device of the present invention is provided with an evaluation value calculation unit and a graph creation unit. The evaluation value calculation unit calculates, within an evaluation value calculation range indicating a target range for calculating evaluation values, an evaluation value for each cluster that is classified on the basis of multi-dimensional process data output from each measurement device. The graph creation unit determines a hue for a graph element for each cluster on the basis of the evaluation value for the cluster as calculated within the evaluation value calculation range, and on the basis of a color reference evaluation value corresponding to a reference hue for the graph element, and creates and outputs a graph representing, for each aggregation unit time interval in a specified display period, the number of nodes belonging to each cluster.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.