Patent · US Active

Method for checking a sensor value of a MEMS sensor

US11396449B2 · kind B2 · utility

0Cited by
0References
14Claims
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Assignee

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Key dates

Filing dateNov 15, 2019
Grant dateJul 26, 2022
Priority date
Expiry dateJun 24, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2221/034
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method is provided for checking a sensor value of a MEMS sensor. In the process, an output signal of the MEMS sensor is detected and the sensor value is ascertained as a function of the output signal. In addition, frequency components of the output signal are examined and a determination is made as to whether the ascertained sensor value is reliable or unreliable as a function of the examination of the frequency components. If the sensor value is determined to be unreliable, the sensor value is discarded or provided with a lower weighting, or a warning it output relating to the unreliability of the sensor value or an item of information about the unreliability of the sensor value is stored.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.