Contact force measuring device and process for measuring a contact force using the contact force measuring device
US11397118B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2020 |
| Grant date | Jul 26, 2022 |
| Priority date | — |
| Expiry date | Nov 21, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L1/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact force measuring device for measuring a contact force of a spring contact includes a measuring probe having a height in a contact region identical to the height of the contact pin that fits into an opening defined between a pair of opposing spring contact arms of the spring contact. The probe includes an upper insulator element attached to an upper side of a piezoelectric element, and a lower insulator element is attached to a lower side of the piezoelectric element opposite the upper side. The contact force measuring device includes a holding device connected to one end of the probe, an evaluation unit, a supporting device and a positioning device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.