Systems, devices and methods for analyzing constituents of a material under test
US11397159B1 · kind B1 · utility
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19Claims
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Key dates
| Filing date | Sep 3, 2019 |
| Grant date | Jul 26, 2022 |
| Priority date | — |
| Expiry date | Aug 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/09
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing constituents of a material under test is disclosed. The method includes obtaining a plurality of impedance spectroscopy measurements of the material under test over a predetermined frequency range. A data set is passed to a machine learning system, the machine learning system having been trained to return an output related to one or more constituents in the material under test based on impedance spectroscopy measurement data over the predetermined frequency range. An output of the machine learning system is received and outputted. Related systems, methods and devices are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.