System for tuning parameters of a thermal sensor to improve object detection
US11397439B1 · kind B1 · utility
2Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2020 |
| Grant date | Jul 26, 2022 |
| Priority date | — |
| Expiry date | Dec 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques associated with generating or tuning parameters associated with long wave infrared sensor data to improve object detection associated with the captured images are discussed herein. The system may determine a region of interest associated with the sensor data and adjust or tune the parameters to improve detection(s) within the region of interest. Additionally, the system may adjust the parameters based on map data and/or environmental conditions, such as weather and temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.