Proximity sensors and methods for operating the same
US11402202B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jun 14, 2018 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | May 10, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K17/9631
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optoelectronic device has an asymmetric field overlap and is operable to measure proximity independently of object surface reflectivity. In some instances, the optoelectronic device includes a plurality of light-emitting assemblies and a light-sensitive assembly. In some instances, the optoelectronic devices include a plurality of light-sensitive assemblies and a light-emitting assembly. An asymmetric field overlap is attained in various implementations via various field-of-view axis, field-of-view angle, field-of-illumination axis, field-of-illumination angle, optical element and/or pitch configurations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.