Geometric calibration of X-ray imaging systems
US11402524B2 · kind B2 · utility
17Cited by
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Key dates
| Filing date | Nov 14, 2018 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | Apr 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/2985
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An apparatus for calibrating an X-ray imaging system including: an X-ray source including a plurality of focal spots; a detector panel; and at least one planar structure including markers placed at pre-determined positions on the at least one planar structure, the at least one planar structure configured to estimate a position of the plurality of focal spots with respect to the detector panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.