Repairing method for broken gate and data line in array substrate and array substrate
US11402709B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 10, 2018 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | Aug 17, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136272
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A repairing method for an array substrate is provided. The array substrate includes at least one defective signal line, which is a data line or a gate line having a breakpoint. The defective signal line is divided by the breakpoint into a first portion and a second portion. The repairing method includes disconnecting a connection between a first thin film transistor and a data line or a gate line to which the first thin film transistor is connected, the first thin film transistor being a thin film transistor closest to the breakpoint among thin film transistors connected to the first portion; electrically connecting a first terminal of the first thin film transistor to the first portion; and taking a common electrode line segment from a common electrode line to which the first pixel electrode corresponds as a repair line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.