Method, apparatus and measurement device for measuring distortion parameters of a display device, and computer-readable medium
US11403745B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 26, 2019 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | Sep 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30208
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides a method, apparatus, and measurement device for measuring distortion parameters of a display device, and a computer-readable medium. The display device includes a display screen and a lens located on a light exiting side of the display screen, and the method includes: acquiring a distortion image which is generated by imaging an initial image through the lens, wherein the initial image is an image displayed on the display screen, the initial image comprises a plurality of first corner points, and the distortion image comprises a plurality of second corner points which match the plurality of first corner points respectively; and determining the distortion parameters of the display device according to a locational relationship between the second corner points and a first corner points which match the second corner points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.