System and method for selecting colonies
US11405592B2 · kind B2 · utility
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27Claims
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Key dates
| Filing date | Nov 2, 2017 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | Jun 16, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N7/183
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.