Patent · US Active

Polishing compositions for reduced defectivity and methods of using the same

US11407923B2 · kind B2 · utility

1Cited by
1References
29Claims
0Family size

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Key dates

Filing dateJan 29, 2021
Grant dateAug 9, 2022
Priority date
Expiry dateJan 29, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Chemical mechanical polishing compositions include an abrasive, an additive, and water. The polishing compositions have a value of less than 800,000 for the relation: large particle counts/weight percent abrasive, when measured using a 0.2 μm bin size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.