Method and systems for the non-invasive optical characterization of a heterogeneous medium
US11408723B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 16, 2019 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | Jul 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for the non-invasive optical characterization of a heterogeneous medium, comprising: a step of illuminating, by means of a series of incident light waves, a given field of view of the heterogeneous medium, positioned in a focal plane of a microscope objective (30); a step of determining a first distortion matrix (Dur, Drr) in an observation basis defined between a conjugate plane of the focal plane (FP) and an observation plane, said first distortion matrix corresponding, in a correction basis defined between a conjugate plane of the focal plane and an aberration correction plane, to the term-by-term matrix product of a first reflection matrix (Rur) of the field of view, determined in the correction basis, with the phase conjugate matrix of a reference reflection matrix, defined for a model medium, in said correction basis; and a step of determining, from the first distortion matrix, at least one mapping of a physical parameter of the heterogeneous medium.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.