Spectral sensor for multispectral imaging
US11408769B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 3, 2019 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | Oct 8, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2826
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectral sensor comprises (i) a first type of interference filter comprising reflective multilayers of a first type and an intermediate layer configured to give a constructive interference for a wavelength in a first range, and (ii) a second type of interference filter comprising reflective multilayers of a second type and an intermediate layer configured to give a constructive interference for a wavelength in a second range. The sensor further comprises first and second filter stacks configured to selectively transmit light in the first and second wavelength ranges to first and second photo-sensitive areas, respectively. The first filter stack includes the first type of interference filter and a second type of dielectric mirror that is reflective in the second wavelength range. The second filter stack includes the second type of interference filter and a first type of dielectric mirror that is reflective in the first wavelength range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.