Terahertz spectrum measurement method and system based on unequal optical path method
US11408823B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2021 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | May 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Terahertz spectrum measurement method and system based on an unequal optical path method is provided. By using a Femtosecond laser and a Terahertz time-domain spectroscopy system, samples to be measured and having different thicknesses are subjected to scanning by time-domain Terahertz signals to obtain transmission signals of the samples with two different thicknesses. The signal after passing through a sample with the thickness of d1 is a reference signal, and the signal after passing through a sample with the thickness of d2 is a sample signal. When Terahertz waves are normally incident to the samples and having different thicknesses, the signals emitted from the samples have an optical path difference therebetween. Phase-containing frequency spectra are obtained after time-domain signals are subjected to Fourier transform. The parameters, such as a refractive index, an extinction coefficient, and an absorption coefficient, can be calculated through the extracted phase-containing frequency spectrums.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.