Functional testing with inline parametric testing
US11408927B2 · kind B2 · utility
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24Claims
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Key dates
| Filing date | Jun 18, 2019 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | Sep 4, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3181
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example test system includes a circuit to sample a signal that is repetitive in cycles to obtain data; a processor configured to generate an eye diagram based on the data, where the eye diagram represents parametric information about the signal; and a functional test circuit to receive the signal and to perform one or more functional tests on the signal. The test systems is configured to receive the signal from a unit under test and to allow the signal to pass to the functional test circuit inline without changing at least part of the signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.