Patent · US Active

Device and method for determining the pinpoint-ability of possible defects of one or multiple component(s)

US11409273B2 · kind B2 · utility

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3References
10Claims
0Family size

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Key dates

Filing dateDec 11, 2017
Grant dateAug 9, 2022
Priority date
Expiry dateSep 15, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/16
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A device for determining whether a defect of a component is determinable based on results of predefined diagnostic options, including: storing, in a matrix, parameters which, for each combination of one component defect and one diagnosis result, provide a measure of whether the respective defect is possible for the respective diagnosis result, the matrix rows being assigned to one of the diagnosis results, the matrix columns being assigned to one of the defects; selecting at least two matrix rows which, for a diagnosis result consistent with the defect to be identified, include a parameter greater than a predefined first limiting value; calculating a result vector by the element-wise multiplication of the selected matrix rows; and determining whether the result vector includes at least one element not smaller than a predefined second limiting value, the result vector elements, which are smaller, not being greater than a predefined third limiting value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.