Management of sensor failure in a facility
US11412185B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2020 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | Dec 21, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/004
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Sensors in a facility generate sensor data associated with a region of the facility, which can be used to determine a 3D location of an object in the facility. Some sensors may sense overlapping regions of the facility. For example, a first sensor may generate data associated with a first region of the facility, while a second sensor may generate data associated with a second region of the facility that partially overlaps the first region. Sensors may fail at times as determined from sensor output data or status data. In response to identifying a failed sensor, an undetected region corresponding to the failed sensor is identified, as well as a substitute sensor that partially senses the undetected region. Sensor data from the substitute sensor, such as 2D data, is acquired and used to estimate a 3D location of an object in the undetected region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.