Particulate observation device and particulate observation method
US11415500B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2019 |
| Grant date | Aug 16, 2022 |
| Priority date | — |
| Expiry date | Dec 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0238
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The purpose of the present invention is to provide a particulate observation device using light scattering, which includes a means for determining the three-dimensional position of a particle, and can measure an accurate particle size or impart various properties of same. The present invention is characterized by including a position determination means which captures, with an optical microscope, an image of light scattered from particles in a dispersion medium to which laser light is emitted, and determines a three-dimensional position of each particle from the obtained two dimensional image, wherein the position determination obtains two-dimensional coordinates along the two-dimensional image from luminescent point positions of the particles, and determines the depth position along a coordinate axis vertical to the two-dimensional image from the diameters of diffraction fringes of the luminescent points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.