Contact probe and electrical connection jig
US11415599B2 · kind B2 · utility
0Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2017 |
| Grant date | Aug 16, 2022 |
| Priority date | — |
| Expiry date | May 15, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2886
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact probe may include a Ni pipe that may include a coiled spring structure, and the Ni pipe 11 may contain 0.5 to 10 wt % of phosphorus (P). The contact probe may have improved durability, by reducing shrinkage, after probing performed in a high temperature environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.