Method for automatically testing processor

US11415627B2 · kind B2 · utility

Inventors

• Tao Zeng · Lo Wu, CN
• Yong Wang · Lo Wu, CN

Key dates

• Filing date: Oct 31, 2018
• Grant date: Aug 16, 2022
• Expiry date: Sep 17, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/2273
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention relates to processor testing technology, specifically relating to a method for automatically testing a processor, the method comprising: S1, carrying out test preparation; S2, setting an operation voltage and a clock frequency of a processor to be tested; S3, carrying out load testing at the current operation voltage and clock frequency; S4, determining whether the processor is normal during current load testing; if yes, then turning to step S5; if no, then raising the current operation voltage by a first growth value and returning to step S2; and S5, recording an operation voltage, subject to load testing, which corresponds to the current clock frequency as a test result and determining whether the current clock frequency reaches an upper limit; if yes, then ending the operation; if no, then raising the current clock frequency by a second growth value and returning to step S2. The described method is capable of implementing the automatic testing of processors and rapidly and effectively obtaining operation voltages corresponding to clock frequencies when the processors are operating normally, and is thus suitable for a plurality of platforms.