XRF analyzer with improved resolution by using micro-reset
US11415710B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 28, 2016 |
| Grant date | Aug 16, 2022 |
| Priority date | — |
| Expiry date | Mar 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/304
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an electronic system for resetting the voltage of a charge-sensitive pre-amplifier having input from an X-ray detector and output to an ADC. The pre-amplifier gain is increased so that the RMS ADC noise is less than 1% of a representative digitized X-ray signal. The reset logic is configured to avoid loss of X-ray counts and to prevent the pre-amplifier output being outside the allowable input range of the ADC. Reset is initiated when the pre-amplifier output rises above an upper level, which is below the maximum allowable ADC input. Reset is also initiated when a pile-up event is detected, provided that such reset will not cause the pre-amplifier output to fall below the minimum allowable ADC input. At each reset a known amount of charge is removed from the pre-amplifier, and the reset time is continuously adjusted to ensure that the charge amount does not drift.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.