Systems and methods for failure diagnosis using fault tree
US11416326B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2020 |
| Grant date | Aug 16, 2022 |
| Priority date | — |
| Expiry date | Aug 28, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0793
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for failure diagnosis using fault tree can include: receiving a fault tree comprising a node representing a top event, a plurality of nodes representing respective basic events, and one or more logic gates connecting the plurality of nodes representing the respective basic events to the node representing the top event; obtaining reliability parameters corresponding to the basic events; calculating fault tree importance measures corresponding to the basic events; calculating failure impact factors of the top event corresponding to the basic events, wherein the failure impact factors of the top event are products of the corresponding reliability parameters and the corresponding fault tree importance measures; ranking the basic events based on the failure impact factors of the top event; and identifying a most significant contributor to the top event, wherein the most significant contributor is a basic event having the highest failure cause probability of the top event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.