Integrated circuit device with integrated fault monitoring system

US11416378B2 · kind B2 · utility

Assignee

• NXP B.V. · NL

Inventors

• Jan-Peter Schat · Hamburg, DE
• Xavier Hours · Tournefeuille, FR
• Andres Barrilado Gonzalez · Toulouse, FR

Key dates

• Filing date: May 13, 2019
• Grant date: Aug 16, 2022
• Expiry date: Mar 20, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/261
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit device is disclosed. The device includes a circuit configured to perform a function, a fault management component, at least one user register, an analog test bus component, a built-in self-test component, a safety monitor component, and gating logic. Additionally, the circuit is separated from the fault management component, the at least one user register, the analog test bus component, the built-in self-test component, the safety monitor, and the gating logic.