System and method for generating hierarchical level-of-detail measurements for runtime calculation and visualization
US11417073B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2021 |
| Grant date | Aug 16, 2022 |
| Priority date | — |
| Expiry date | Jul 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, devices, and non-transitory media of the various embodiments enable generating at least one hierarchical-level-of-detail (LOD) data structure in order to visualize and traverse measurement data associated with a three-dimensional (3D) model. In various embodiments, generating at least one hierarchical LOD data structure may include establishing a background grid comprising a mathematical grid structure defined in a common coordinate system, building a layout comprising an intermediary data structure, computing measurement data for each tile based at least in part on the height data samples, and storing at least a portion of the computed measurement data for each tile in a metadata file.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.