Patent · US Active

Sensor and double integration method for capturing thermal patterns

US11422036B2 · kind B2 · utility

0Cited by

6References

15Claims

0Family size

Assignees

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES · FR
IDEMIA IDENTITY & SECURITY FRANCE · FR

Inventors

Jean-Francois Mainguet · Grenoble, FR
Joël-Yann Fourre · Paris, FR

Key dates

Filing date	Jul 8, 2020
Grant date	Aug 23, 2022
Priority date	—
Expiry date	Mar 2, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01J2005/345
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method for capturing a thermal pattern by a sensor comprising a plurality of pixels each comprising a heat-sensitive measuring element, the method comprising, for each pixel:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.