Patent · US Active

System and method for determining second order nonlinear susceptibility of material

US11428630B2 · kind B2 · utility

0Cited by

0References

14Claims

0Family size

Assignee

Nankai University · CN

Inventors

Meng-Xin Ren · Tianjin, CN
Jun Ma · Jiaocheng District, CN
Jia Chen · Tangxia, CN
Wei Wu · Tianjin, CN
Wei Cai · The Bronx, US
Jing Xu · Lanzhou, CN

Key dates

Filing date	Apr 3, 2020
Grant date	Aug 30, 2022
Priority date	—
Expiry date	Dec 12, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG02F1/3503
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for determining a second-order nonlinear susceptibility of a material includes a laser light source, a polarization modulator, a light collector, a polarization detector and a controller. The controller can obtain the second-order nonlinear susceptibility of the sample to be tested according to the test data. The system for determining the second-order nonlinear susceptibility of a material can directly test a material (block or film) with a thickness of hundreds of nanometers, and draw a second-order nonlinear susceptibility fitting curve of the material according to the test results of the optical system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.