Method for establishing a spectral response function of a system for measuring with X-rays or gamma rays
US11428649B2 · kind B2 · utility
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10Claims
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Key dates
| Filing date | Jan 15, 2021 |
| Grant date | Aug 30, 2022 |
| Priority date | — |
| Expiry date | Mar 13, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/501
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a response of a spectrometric system for measuring ionizing x-ray or gamma-ray photons, the measuring system comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.