Arrangement for non-destructive testing and a testing method thereof
US11428671B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2019 |
| Grant date | Aug 30, 2022 |
| Priority date | — |
| Expiry date | May 22, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2691
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An arrangement for non-destructive testing of a component part, which may include a first end surface and a second opposite end surface. The arrangement may include a plurality of discrete piezoelectric transduction elements arranged in a circular array on the first end surface, and an electric wave signal transmitting and receiving unit electrically coupled to the piezoelectric transduction elements. The electric wave signal transmitting and receiving unit may be able to generate an electric excitation wave signal and to receive an electric response wave signal. The piezoelectric transduction elements may deform, upon an application of the electric excitation wave signal, in an in-phase shearing motion parallel to the first end surface and in respective tangential direction with respect to the circular array so as to generate a corresponding structure-borne wave in the component part at the first end surface such that said structure-borne wave can propagate in the component part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.