Image inspection device, image forming apparatus, and image inspection method
US11431876B2 · kind B2 · utility
0Cited by
2References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2020 |
| Grant date | Aug 30, 2022 |
| Priority date | — |
| Expiry date | Sep 29, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/40068
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image inspection device detects an abnormality of a formed image by comparing imaged data obtained by imaging the formed image with original image data of the formed image. The image inspection device includes a hardware processor that: adjusts the original image data to reduce sharpness of the original image data; and detects the abnormality by comparing the adjusted original image data with the obtained imaged data. The hardware processor partly restricts the reduction of the sharpness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.