Accelerated measurements through adaptive test parameter selection
US11435394B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2017 |
| Grant date | Sep 6, 2022 |
| Priority date | — |
| Expiry date | Jan 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring electrical response of a DUT includes using a measurement instrument, generating a radio frequency (RF) test signal via the measurement instrument at one or more initial frequencies, propagating the RF test signal at the one or more initial frequencies to the DUT, measuring a response of the DUT at the one or more initial frequencies and aggregating the measured response of the DUT at the one or more initial frequencies as response measurement data. The method then includes iteratively performing, until characterization of the DUT achieves a minimum criterion, the steps of adaptively selecting an additional frequency at which to generate a RF test signal based on the response measurement data based on a predetermined adaptive frequency algorithm, generating the RF test signal at the adaptively selected additional frequency, measuring a response of the DUT at the adaptively selected additional frequency, and adding the measured response of the DUT at the adaptively selected additional frequency to the response measurement data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.