Efficient laser-induced single-event latchup and methods of operation
US11435399B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2018 |
| Grant date | Sep 6, 2022 |
| Priority date | — |
| Expiry date | Jul 8, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2881
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for testing a threshold energy required to cause a latchup on an electronic component. An exemplary method includes applying a series of laser pulses to a testing object with a pulsed laser unit. The testing object is connected to a testing circuit which can measure the energy of each of the series of laser pulses, and detect whether a pulse of the series of laser pulses resulted in a latchup on the testing object. Upon detecting the pulse, the method provides for logging the energy of the pulse using a recording unit and logging the latchup status of the test device. If a latchup is detected, the testing circuit automatically mitigates the latchup event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.