Patent · US Active

Testing machine learning (ML) models for robustness and accuracy using generative deep learning

US11436443B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

ACCENTURE GLOBAL SOLUTIONS LIMITED · IE

Inventors

Indrajit Kar · Kanchinakote, IN
Shalini Agarwal · San Francisco, US
Vishal Pandey · Kanchinakote, IN
Mohammed C. Salman · Santa Clara, US
Sushresulagna Rath · Kanchinakote, IN

Key dates

Filing date	May 5, 2020
Grant date	Sep 6, 2022
Priority date	—
Expiry date	Apr 21, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20084
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A model testing system administers tests to machine learning (ML) models to test the accuracy and the robustness of the ML models. A user interface (UI) associated with the model testing system receives selections of one or more of a plurality of tests to be administered to a ML model under test. Test data produced by one or more of a plurality of testing ML models that correspond to the plurality of tests is provided to the ML model under test based on the selected tests. One or more of a generative patches test, a generative perturbations test and a counterfeit data test can be administered to the ML model under test based on the selections.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.