System monitoring with metrics correlation for data center
US11438245B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2020 |
| Grant date | Sep 6, 2022 |
| Priority date | — |
| Expiry date | Mar 13, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/20
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A first set of values for a set of metrics is obtained. A given metric of the set of metrics monitors a given component of a set of components of a computing system. The first set of values is obtained during a period of expected behavior of the computing system. One or more correlations are determined between values of the first set of values to establish one or more expected correlations between values of two or more metrics. A second set of values for the set of metrics is obtained. A determination is made as to whether values of the second set of values maintain the one or more expected correlations determined based on the first set of values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.