Patent · US Active

Devices and methods for monitoring, in particular for regulating, a cutting process

US11440141B2 · kind B2 · utility

0Cited by
3References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 2019
Grant dateSep 13, 2022
Priority date
Expiry dateOct 9, 2040

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K26/38
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The invention relates to devices and methods for monitoring or regulating a cutting process on a workpiece. A focusing element focuses a high-energy beam onto the workpiece. An image capture apparatus captures a region at the workpiece to be monitored. The region includes an interaction region of the high-energy beam with the workpiece. An control apparatus determines at least one characteristic variable of the cutting process, in particular of a kerf formed during the cutting process, on the basis of the captured interaction region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.