Distance measurements using spectrometer systems
US11441945B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2019 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Nov 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/104
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example system includes a light source, a first spectrometer, a second spectrometer, and an electronic control module. The light source is operable to emit light within a first range of wavelengths in a field of illumination. The first spectrometer is operable to measure first sample light reflected from an object within a second range of wavelengths and in a first field of detection. The second spectrometer is operable to measure second sample light reflected from the object within a third range of wavelengths and in a second field of detection. The electronic control module operable to determine, based on the measured first sample light and the measured second sample light, a distance between the system and the object, and determine, based on the measured first sample light and the measured second sample light, a spectral distribution of light corresponding to the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.