Variable dip fault slip simulation test method
US11441982B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jan 13, 2022 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Jan 13, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0658
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure provides a variable dip fault slip simulation test method, which relates to the technical field of indoor simulation test of underground engineering. The variable dip fault slip simulation test method of the disclosure adopts a sample device and a loading device, which includes the following steps: Step 1. sample preparation; Step 2. sample assembly; Step 3. loading preparation; Step 4. sample loading. The variable dip fault slip simulation test method of the disclosure can prepare rock like samples with different dip interfaces, simulate the slip failure process of faults with different dip angles, as well as the normal dip slip and reverse dip slip of faults, facilitate the operation of slip simulation test, and collect test data automatically and accurately.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.