Polygonal spherical space sampling device
US11442094B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2021 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Jun 1, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K9/0009
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.