Generating a waveform based on digital pulses
US11442098B2 · kind B2 · utility
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17References
40Claims
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Key dates
| Filing date | Jun 20, 2019 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Aug 15, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31908
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.