Configurable integrated logic analyzer
US11442104B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 2020 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Sep 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for collecting operational data from a target digital system are disclosed. In some embodiments, a method includes determining a test configuration to be used to configure a probe circuit. Determining the test configuration may include selecting one or more signal sources, defining one or more signal patterns within the selected signal sources, and defining one or more trigger events associated with the one or more signal patterns. Based on the test configuration, the probe circuit selects input/output (I/O) channels for a test cycle and captures one or more traces from the selected I/O channels during the test cycle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.