Systems and methods for automatic test generation
US11442845B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2020 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Dec 7, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3604
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method comprising obtaining a first candidate test associated with a testable component, wherein the first candidate test comprises an input having an input value; generating a second candidate test associated with the testable component by performing a dynamic mutation-based fuzzing of the first candidate test, wherein the second candidate test is based on the first candidate test and comprises a modified input value for the input based on data generated during an execution of the first candidate test or domain knowledge associated with the testable component; and creating a test for the testable component based on the first candidate test or the second candidate test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.