Method of spectroscopically characterizing a surface
US11448593B1 · kind B1 · utility
2Cited by
1References
26Claims
0Family size
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Key dates
| Filing date | Mar 4, 2020 |
| Grant date | Sep 20, 2022 |
| Priority date | — |
| Expiry date | Dec 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method for performing reflectivity measurements at a distance by receiving two or more reflected signals (using two or more different wavelength sweeps) and calculating ratios of the two (or more) received reflected signals, for the purpose of determining the composition of a material or surface at a distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.